Reference record for OID 1.3.6.1.4.1.74.2.14.2.5

parent

1.3.6.1.4.1.74.2.14.2 (rh1SelfTestCapability)

node code

5

node name

rh1SelfTestRackHealthData

dot oid

1.3.6.1.4.1.74.2.14.2.5

type

OBJECT-TYPE

asn1 oid

{iso(1) identified-organization(3) dod(6) internet(1) private(4) enterprise(1) att-2(74) att-mgmt(2) att-rh1mgt(14) rh1SelfTestCapability(2) rh1SelfTestRackHealthData(5)}

{iso(1) identified-organization(3) dod(6) internet(1) private(4) enterprises(1) att-2(74) att-mgmt(2) att-rh1mgt(14) rh1SelfTestCapability(2) rh1SelfTestRackHealthData(5)}

{iso(1) org(3) dod(6) internet(1) private(4) enterprise(1) att-2(74) att-mgmt(2) att-rh1mgt(14) rh1SelfTestCapability(2) rh1SelfTestRackHealthData(5)}

{iso(1) org(3) dod(6) internet(1) private(4) enterprises(1) att-2(74) att-mgmt(2) att-rh1mgt(14) rh1SelfTestCapability(2) rh1SelfTestRackHealthData(5)}

{iso(1) iso-identified-organization(3) dod(6) internet(1) private(4) enterprise(1) att-2(74) att-mgmt(2) att-rh1mgt(14) rh1SelfTestCapability(2) rh1SelfTestRackHealthData(5)}

{iso(1) iso-identified-organization(3) dod(6) internet(1) private(4) enterprises(1) att-2(74) att-mgmt(2) att-rh1mgt(14) rh1SelfTestCapability(2) rh1SelfTestRackHealthData(5)}

iri oid

/iso/identified-organization/dod/internet/private/enterprise/att-2/att-mgmt/att-rh1mgt/rh1SelfTestCapability/rh1SelfTestRackHealthData

/iso/identified-organization/dod/internet/private/enterprises/att-2/att-mgmt/att-rh1mgt/rh1SelfTestCapability/rh1SelfTestRackHealthData

/iso/org/dod/internet/private/enterprise/att-2/att-mgmt/att-rh1mgt/rh1SelfTestCapability/rh1SelfTestRackHealthData

/iso/org/dod/internet/private/enterprises/att-2/att-mgmt/att-rh1mgt/rh1SelfTestCapability/rh1SelfTestRackHealthData

/iso/iso-identified-organization/dod/internet/private/enterprise/att-2/att-mgmt/att-rh1mgt/rh1SelfTestCapability/rh1SelfTestRackHealthData

/iso/iso-identified-organization/dod/internet/private/enterprises/att-2/att-mgmt/att-rh1mgt/rh1SelfTestCapability/rh1SelfTestRackHealthData

iri by oid_info

/ISO/Identified-Organization/6/1/4/1/74/2/14/2/5

Description by oid_info

rh1SelftestRackHealthData
View at oid-info.com

Description by mibdepot

This object gives data on the health of all major rack
components. The object is an octet string with a size of
103 octets broken 6 sections:
Reason for trap
Chassis failure conditions
Debugging data
Test result map
Card failure map
Diagnostic results registers

The sections are encoded as follows:

Octet Definition

Reason for trap

0 Reason for trap
0 no trap
1 non-disruptive test
2 disruptive test
3 temperature condition
4 fan failure
5 power supply failure
6 Deadman timer expired
7 Software panic occured
8 Sanity Reset occured
9 Configuration checksum failure



Chassis failure conditions

1 Temperature condition
0 OK
1 High
2 Fan condition
0 OK
1 Fan 1 failed
2 Fan 2 failed
3 Fan 1 and Fan 2 failed
3 Power supply condition
0 OK
1 Supply 1 failed
2 Supply 2 failed

Debugging data

4-5 Software panic counters
6-7 ID last module panic
8-9 Line number of last panic
10-13 NAU control dead man timer
14-17 Sanity reset counter
18 NVRAM configuration checksum

Test Result Map (any bit set to 1 indicates the test
failed on at least one card)
The map supports a total of 32 tests
of which 17 are reserved for future use

19 Disruptive Rack tests (Self Test 2)
bit
Test 1 0 SRAM R/W
Test 2 1 SRAM Address
Test 3 2 MPR Registers
Test 4 3 Security R/W
Test 5 4 NAU Memory R/W
Test 6 5 NAU Memory Address
Test 7 6 NAU IRQ
Test 8 7 NAU Self Test

20
Test 9 0 NAU Loopback
Test 10 1 NAU Registers
Test 11 2 Slot 0 EAROM
Test 12-16 3-7 Reserved for future use



Non-Disruptive Rack tests (Self Test 1)
bit
21
Test 17 0 SRAM R/W
Test 18 1 SRAM Address
Test 19 2 Flash Checksum
Test 20 3 Flash Read
Test 21 4 NAU I/O
Test 22 5 NAU Memory R/W
Test 23-24 6-7 Reserved for future use

22
Test 25-32 0-7 Reserved for future use


Card Failure Map
For each test in the Test Result map, there is are two
corresponding octects in the card failure map. The octects
are positionally encoded to represent the cards in the rack,
if a bit is set (1) it indicates which card failed that test
(more than one bit may be set). Bit 0 is the Bus Logic Unit
(slot 0), and bits 1 to 15 are cards 1 to 15 respectively
(note the SmartHUB XE only supports 7 cards at this time)

Octet

23, 24 Test 1 card results
25, 26 Test 2 card results
27, 28 Test 3 card results
29, 30 Test 4 card results
31, 32 Test 5 card results
33, 34 Test 6 card results
35, 36 Test 7 card results
37, 38 Test 8 card results
39, 40 Test 9 card results
41, 42 Test 10 card results
43, 33 Test 11 card results
45, 46 Test 12 card results
47, 48 Test 13 card results
49, 50 Test 14 card results
51, 52 Test 15 card results
53, 54 Test 16 card results
55, 56 Test 17 card results
57, 58 Test 18 card results
59, 60 Test 19 card results
61, 62 Test 20 card results
63, 64 Test 21 card results
65, 66 Test 22 card results
67, 68 Test 23 card results
69, 70 Test 24 card results
71, 72 Test 25 card results
73, 74 Test 26 card results
75, 76 Test 27 card results
77, 78 Test 28 card results
79, 80 Test 29 card results
81, 82 Test 30 card results
83, 84 Test 31 card results
85, 86 Test 32 card results


Diagnostic Register Results
All boards also support a diagnostic register which contains
a code corresponding to the current health of that board.
(This is especially useful for non-MPR boards which don't
report other diagnostics through this MIB)
Definitions for diagnostic register:


0x00 to 0xEF Vendor specific
Display as 'error code: xx'

0xF0 Power on reset value
After timeout X1 Display as 'reset failure'

0xF1 Diagnostics passed
Display as 'passed'

0xF2 General failure Major
Display as 'failed'

0xF3 General failure Minor
Display as 'failed'

0xF4 Checksum error
Display as 'checksum error'
(note: this value for a bad flash image)

0xF5 Configuration error
Display as 'configuration error'

0xF6 to 0xFD Reserved for future use
Display as 'error code: xx'

0xFE Running diagnostics, extended timeout
On timeout X2 display as 'diagnostic timeout'

0xFF Running diagnostics, standard timeout
On timeout X3 display as 'diagnostic timeout'





Octet

87 Slot 0 diagnostic register
88 Slot 1 diagnostic register
89 Slot 2 diagnostic register
90 Slot 3 diagnostic register
91 Slot 4 diagnostic register
92 Slot 5 diagnostic register
93 Slot 6 diagnostic register
94 Slot 7 diagnostic register
95 Slot 8 diagnostic register
96 Slot 9 diagnostic register
97 Slot 10 diagnostic register
98 Slot 11 diagnostic register
99 Slot 12 diagnostic register
100 Slot 13 diagnostic register
101 Slot 14 diagnostic register
102 Slot 15 diagnostic register

Parsed from file ncr-mib.txt
Company: None
Module: RH-ATT-MIB

Description by circitor

This object gives data on the health of all major rack
components. The object is an octet string with a size of
103 octets broken 6 sections:
Reason for trap
Chassis failure conditions
Debugging data
Test result map
Card failure map
Diagnostic results registers

The sections are encoded as follows:

Octet Definition

Reason for trap

0 Reason for trap
0 no trap
1 non-disruptive test
2 disruptive test
3 temperature condition
4 fan failure
5 power supply failure
6 Deadman timer expired
7 Software panic occured
8 Sanity Reset occured
9 Configuration checksum failure



Chassis failure conditions

1 Temperature condition
0 OK
1 High
2 Fan condition
0 OK
1 Fan 1 failed
2 Fan 2 failed
3 Fan 1 and Fan 2 failed
3 Power supply condition
0 OK
1 Supply 1 failed
2 Supply 2 failed

Debugging data

4-5 Software panic counters
6-7 ID last module panic
8-9 Line number of last panic
10-13 NAU control dead man timer
14-17 Sanity reset counter
18 NVRAM configuration checksum

Test Result Map (any bit set to 1 indicates the test
failed on at least one card)
The map supports a total of 32 tests
of which 17 are reserved for future use

19 Disruptive Rack tests (Self Test 2)
bit
Test 1 0 SRAM R/W
Test 2 1 SRAM Address
Test 3 2 MPR Registers
Test 4 3 Security R/W
Test 5 4 NAU Memory R/W
Test 6 5 NAU Memory Address
Test 7 6 NAU IRQ
Test 8 7 NAU Self Test

20
Test 9 0 NAU Loopback
Test 10 1 NAU Registers
Test 11 2 Slot 0 EAROM
Test 12-16 3-7 Reserved for future use



Non-Disruptive Rack tests (Self Test 1)
bit
21
Test 17 0 SRAM R/W
Test 18 1 SRAM Address
Test 19 2 Flash Checksum
Test 20 3 Flash Read
Test 21 4 NAU I/O
Test 22 5 NAU Memory R/W
Test 23-24 6-7 Reserved for future use

22
Test 25-32 0-7 Reserved for future use


Card Failure Map
For each test in the Test Result map, there is are two
corresponding octects in the card failure map. The octects
are positionally encoded to represent the cards in the rack,
if a bit is set (1) it indicates which card failed that test
(more than one bit may be set). Bit 0 is the Bus Logic Unit
(slot 0), and bits 1 to 15 are cards 1 to 15 respectively
(note the SmartHUB XE only supports 7 cards at this time)

Octet

23, 24 Test 1 card results
25, 26 Test 2 card results
27, 28 Test 3 card results
29, 30 Test 4 card results
31, 32 Test 5 card results
33, 34 Test 6 card results
35, 36 Test 7 card results
37, 38 Test 8 card results
39, 40 Test 9 card results
41, 42 Test 10 card results
43, 33 Test 11 card results
45, 46 Test 12 card results
47, 48 Test 13 card results
49, 50 Test 14 card results
51, 52 Test 15 card results
53, 54 Test 16 card results
55, 56 Test 17 card results
57, 58 Test 18 card results
59, 60 Test 19 card results
61, 62 Test 20 card results
63, 64 Test 21 card results
65, 66 Test 22 card results
67, 68 Test 23 card results
69, 70 Test 24 card results
71, 72 Test 25 card results
73, 74 Test 26 card results
75, 76 Test 27 card results
77, 78 Test 28 card results
79, 80 Test 29 card results
81, 82 Test 30 card results
83, 84 Test 31 card results
85, 86 Test 32 card results


Diagnostic Register Results
All boards also support a diagnostic register which contains
a code corresponding to the current health of that board.
(This is especially useful for non-MPR boards which don't
report other diagnostics through this MIB)
Definitions for diagnostic register:


0x00 to 0xEF Vendor specific
Display as 'error code: xx'

0xF0 Power on reset value
After timeout X1 Display as 'reset failure'

0xF1 Diagnostics passed
Display as 'passed'

0xF2 General failure Major
Display as 'failed'

0xF3 General failure Minor
Display as 'failed'

0xF4 Checksum error
Display as 'checksum error'
(note: this value for a bad flash image)

0xF5 Configuration error
Display as 'configuration error'

0xF6 to 0xFD Reserved for future use
Display as 'error code: xx'

0xFE Running diagnostics, extended timeout
On timeout X2 display as 'diagnostic timeout'

0xFF Running diagnostics, standard timeout
On timeout X3 display as 'diagnostic timeout'





Octet

87 Slot 0 diagnostic register
88 Slot 1 diagnostic register
89 Slot 2 diagnostic register
90 Slot 3 diagnostic register
91 Slot 4 diagnostic register
92 Slot 5 diagnostic register
93 Slot 6 diagnostic register
94 Slot 7 diagnostic register
95 Slot 8 diagnostic register
96 Slot 9 diagnostic register
97 Slot 10 diagnostic register
98 Slot 11 diagnostic register
99 Slot 12 diagnostic register
100 Slot 13 diagnostic register
101 Slot 14 diagnostic register
102 Slot 15 diagnostic register

Parsed from file RH-ATT-MIB.mib
Module: RH-ATT-MIB

Information by oid_info

Vendor: AT&T
Module: RH-ATT-MIB

[Automatically extracted from oidview.com]

Information by mibdepot

rh1SelfTestRackHealthData  OBJECT-TYPE
SYNTAX	OCTET STRING
ACCESS	read-only
STATUS	mandatory
DESCRIPTION
"This object gives data on the health of	all major rack
components.  The object	is an octet string with	a size of
103 octets broken 6 sections:
Reason for trap
Chassis	failure	conditions
Debugging data
Test result map
Card failure map
Diagnostic results registers

The sections are encoded as follows:

Octet		Definition

Reason for trap

0			Reason for trap
			0	no trap
			1	non-disruptive test
			2	disruptive test
			3	temperature condition
			4	fan failure
			5	power supply failure
			6	Deadman	timer expired
			7	Software panic occured
			8	Sanity Reset occured
			9	Configuration checksum failure



Chassis	failure	conditions

1			Temperature condition
			0	OK
			1	High
2			Fan condition
			0	OK
			1	Fan 1 failed
			2	Fan 2 failed
			3	Fan 1 and Fan 2	failed
3			Power supply condition
			0	OK
			1	Supply 1 failed
			2	Supply 2 failed

Debugging data

4-5		Software panic counters
6-7		ID last	module panic
8-9		Line number of last panic
10-13		NAU control dead man timer
14-17		Sanity reset counter
18			NVRAM configuration checksum

Test Result Map	(any bit set to	1 indicates the	test
		 failed	on at least one	card)
		 The map supports a total of 32	tests
		 of which 17 are reserved for future use

19			Disruptive Rack	tests (Self Test 2)
			bit
Test 1		0	SRAM R/W
Test 2		1	SRAM Address
Test 3		2	MPR Registers
Test 4		3	Security R/W
Test 5		4	NAU Memory R/W
Test 6		5	NAU Memory Address
Test 7		6	NAU IRQ
Test 8		7	NAU Self Test

20
Test 9		0	NAU Loopback
Test 10		1	NAU Registers
Test 11		2	Slot 0 EAROM
Test 12-16	3-7	Reserved for future use



			Non-Disruptive Rack tests (Self	Test 1)
			bit
21
Test 17		0	SRAM R/W
Test 18		1	SRAM Address
Test 19		2	Flash Checksum
Test 20		3	Flash Read
Test 21		4	NAU I/O
Test 22		5	NAU Memory R/W
Test 23-24		6-7	Reserved for future use

22
Test 25-32	0-7	Reserved for future use


Card Failure Map
For each test in the Test Result map, there is are two
corresponding octects in the card failure map.	The octects
are positionally encoded to represent the cards	in the rack,
if a bit is set	(1) it indicates which card failed that	test
(more than one bit may be set).	 Bit 0 is the Bus Logic	Unit
(slot 0), and	bits 1 to 15 are cards 1 to 15 respectively
(note the SmartHUB XE only supports 7 cards at this time)

Octet

23, 24		Test 1 card results
25, 26		Test 2 card results
27, 28		Test 3 card results
29, 30		Test 4 card results
31, 32		Test 5 card results
33, 34		Test 6 card results
35, 36		Test 7 card results
37, 38		Test 8 card results
39, 40		Test 9 card results
41, 42		Test 10	card results
43, 33		Test 11	card results
45, 46		Test 12	card results
47, 48		Test 13	card results
49, 50		Test 14	card results
51, 52		Test 15	card results
53, 54		Test 16	card results
55, 56		Test 17	card results
57, 58		Test 18	card results
59, 60		Test 19	card results
61, 62		Test 20	card results
63, 64		Test 21	card results
65, 66		Test 22	card results
67, 68		Test 23	card results
69, 70		Test 24	card results
71, 72		Test 25	card results
73, 74		Test 26	card results
75, 76		Test 27	card results
77, 78		Test 28	card results
79, 80		Test 29	card results
81, 82		Test 30	card results
83, 84		Test 31	card results
85, 86		Test 32	card results


Diagnostic Register Results
All boards also	support	a diagnostic register which contains
a code corresponding to	the current health of that board.
(This is especially useful for non-MPR boards which don't
report other diagnostics through this MIB)
Definitions for	diagnostic register:


0x00 to	0xEF	 Vendor	specific
		 Display as 'error code:  xx'

0xF0		 Power on reset	value
		 After timeout X1 Display as 'reset failure'

0xF1		 Diagnostics passed
		 Display as 'passed'

0xF2		 General failure Major
		 Display as 'failed'

0xF3		 General failure Minor
		 Display as 'failed'

0xF4		 Checksum error
		 Display as 'checksum error'
		 (note:	this value for a bad flash image)

0xF5		 Configuration error
		 Display as 'configuration error'

0xF6 to	0xFD	 Reserved for future use
		 Display as 'error code: xx'

0xFE		 Running diagnostics, extended timeout
	       On timeout X2 display as	'diagnostic timeout'

0xFF		 Running diagnostics, standard timeout
	       On timeout X3 display as	'diagnostic timeout'





Octet

87			Slot 0 diagnostic register
88			Slot 1 diagnostic register
89			Slot 2 diagnostic register
90			Slot 3 diagnostic register
91			Slot 4 diagnostic register
92			Slot 5 diagnostic register
93			Slot 6 diagnostic register
94			Slot 7 diagnostic register
95			Slot 8 diagnostic register
96			Slot 9 diagnostic register
97			Slot 10	diagnostic register
98			Slot 11	diagnostic register
99			Slot 12	diagnostic register
100		Slot 13	diagnostic register
101		Slot 14	diagnostic register
102		Slot 15	diagnostic register"

::= { rh1SelfTestCapability 5 }

Information by circitor

rh1SelfTestRackHealthData  OBJECT-TYPE
SYNTAX	OCTET STRING
ACCESS	read-only
STATUS	mandatory
DESCRIPTION
"This object gives data on the health of	all major rack
components.  The object	is an octet string with	a size of
103 octets broken 6 sections:
Reason for trap
Chassis	failure	conditions
Debugging data
Test result map
Card failure map
Diagnostic results registers

The sections are encoded as follows:

Octet		Definition

Reason for trap

0			Reason for trap
			0	no trap
			1	non-disruptive test
			2	disruptive test
			3	temperature condition
			4	fan failure
			5	power supply failure
			6	Deadman	timer expired
			7	Software panic occured
			8	Sanity Reset occured
			9	Configuration checksum failure



Chassis	failure	conditions

1			Temperature condition
			0	OK
			1	High
2			Fan condition
			0	OK
			1	Fan 1 failed
			2	Fan 2 failed
			3	Fan 1 and Fan 2	failed
3			Power supply condition
			0	OK
			1	Supply 1 failed
			2	Supply 2 failed

Debugging data

4-5		Software panic counters
6-7		ID last	module panic
8-9		Line number of last panic
10-13		NAU control dead man timer
14-17		Sanity reset counter
18			NVRAM configuration checksum

Test Result Map	(any bit set to	1 indicates the	test
		 failed	on at least one	card)
		 The map supports a total of 32	tests
		 of which 17 are reserved for future use

19			Disruptive Rack	tests (Self Test 2)
			bit
Test 1		0	SRAM R/W
Test 2		1	SRAM Address
Test 3		2	MPR Registers
Test 4		3	Security R/W
Test 5		4	NAU Memory R/W
Test 6		5	NAU Memory Address
Test 7		6	NAU IRQ
Test 8		7	NAU Self Test

20
Test 9		0	NAU Loopback
Test 10		1	NAU Registers
Test 11		2	Slot 0 EAROM
Test 12-16	3-7	Reserved for future use



			Non-Disruptive Rack tests (Self	Test 1)
			bit
21
Test 17		0	SRAM R/W
Test 18		1	SRAM Address
Test 19		2	Flash Checksum
Test 20		3	Flash Read
Test 21		4	NAU I/O
Test 22		5	NAU Memory R/W
Test 23-24		6-7	Reserved for future use

22
Test 25-32	0-7	Reserved for future use


Card Failure Map
For each test in the Test Result map, there is are two
corresponding octects in the card failure map.	The octects
are positionally encoded to represent the cards	in the rack,
if a bit is set	(1) it indicates which card failed that	test
(more than one bit may be set).	 Bit 0 is the Bus Logic	Unit
(slot 0), and	bits 1 to 15 are cards 1 to 15 respectively
(note the SmartHUB XE only supports 7 cards at this time)

Octet

23, 24		Test 1 card results
25, 26		Test 2 card results
27, 28		Test 3 card results
29, 30		Test 4 card results
31, 32		Test 5 card results
33, 34		Test 6 card results
35, 36		Test 7 card results
37, 38		Test 8 card results
39, 40		Test 9 card results
41, 42		Test 10	card results
43, 33		Test 11	card results
45, 46		Test 12	card results
47, 48		Test 13	card results
49, 50		Test 14	card results
51, 52		Test 15	card results
53, 54		Test 16	card results
55, 56		Test 17	card results
57, 58		Test 18	card results
59, 60		Test 19	card results
61, 62		Test 20	card results
63, 64		Test 21	card results
65, 66		Test 22	card results
67, 68		Test 23	card results
69, 70		Test 24	card results
71, 72		Test 25	card results
73, 74		Test 26	card results
75, 76		Test 27	card results
77, 78		Test 28	card results
79, 80		Test 29	card results
81, 82		Test 30	card results
83, 84		Test 31	card results
85, 86		Test 32	card results


Diagnostic Register Results
All boards also	support	a diagnostic register which contains
a code corresponding to	the current health of that board.
(This is especially useful for non-MPR boards which don't
report other diagnostics through this MIB)
Definitions for	diagnostic register:


0x00 to	0xEF	 Vendor	specific
		 Display as 'error code:  xx'

0xF0		 Power on reset	value
		 After timeout X1 Display as 'reset failure'

0xF1		 Diagnostics passed
		 Display as 'passed'

0xF2		 General failure Major
		 Display as 'failed'

0xF3		 General failure Minor
		 Display as 'failed'

0xF4		 Checksum error
		 Display as 'checksum error'
		 (note:	this value for a bad flash image)

0xF5		 Configuration error
		 Display as 'configuration error'

0xF6 to	0xFD	 Reserved for future use
		 Display as 'error code: xx'

0xFE		 Running diagnostics, extended timeout
	       On timeout X2 display as	'diagnostic timeout'

0xFF		 Running diagnostics, standard timeout
	       On timeout X3 display as	'diagnostic timeout'





Octet

87			Slot 0 diagnostic register
88			Slot 1 diagnostic register
89			Slot 2 diagnostic register
90			Slot 3 diagnostic register
91			Slot 4 diagnostic register
92			Slot 5 diagnostic register
93			Slot 6 diagnostic register
94			Slot 7 diagnostic register
95			Slot 8 diagnostic register
96			Slot 9 diagnostic register
97			Slot 10	diagnostic register
98			Slot 11	diagnostic register
99			Slot 12	diagnostic register
100		Slot 13	diagnostic register
101		Slot 14	diagnostic register
102		Slot 15	diagnostic register"

::= { rh1SelfTestCapability 5 }

First Registration Authority (recovered by parent 1.3.6.1.4.1.74)

Yzhak Ronen

Current Registration Authority (recovered by parent 1.3.6.1.4.1.74)

Jeremy Monroe

Children (1)

Brothers (5)